NSN 5962-01-217-4207 Parts of Microcircuit Memory
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Alternative NSN: 5962-01-217-4207 |
Item Name: Microcircuit Memory |
Federal Supply Class (FSC): 5962 Microcircuits Electronic |
NIIN: 012174207 |
NCB Code: USA (01) |
Manufacturers: Dla Land And Maritime , Fluke Corporation , Nec Electronics Usa Inc , Ramtek Corp |
Part No | Manufacturer | Item Name | QTY | RFQ |
---|---|---|---|---|
1310085-01 | ramtek corp | microcircuit memory | Avl | RFQ |
23128 | nec electronics usa inc | microcircuit memory | Avl | RFQ |
819458 | fluke corporation | microcircuit memory | Avl | RFQ |
650747 | fluke corporation | microcircuit memory | Avl | RFQ |
9000A-9051 | fluke corporation | microcircuit memory | Avl | RFQ |
707166 | fluke corporation | microcircuit memory | Avl | RFQ |
8202502YB | dla land and maritime | microcircuit memory | Avl | RFQ |
Characteristics Data of NSN 5962012174207
MRC | Criteria | Characteristic |
---|---|---|
ADAQ | BODY LENGTH | 1.300 INCHES MAXIMUM |
ADAT | BODY WIDTH | 0.520 INCHES NOMINAL |
ADAU | BODY HEIGHT | 0.205 INCHES MAXIMUM |
AFGA | OPERATING TEMP RANGE | -25.0 TO 75.0 DEG CELSIUS |
AFJQ | STORAGE TEMP RANGE | -65.0 TO 150.0 DEG CELSIUS |
CBBL | FEATURES PROVIDED | PROGRAMMABLE AND MONOLITHIC AND ULTRAVIOLET ERASABLE |
CQSJ | INCLOSURE MATERIAL | CERAMIC |
CQSZ | INCLOSURE CONFIGURATION | DUAL-IN-LINE |
CQWX | OUTPUT LOGIC FORM | N-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
CQZP | INPUT CIRCUIT PATTERN | 17 INPUT |
CWSG | TERMINAL SURFACE TREATMENT | SOLDER |
CZEN | VOLTAGE RATING AND TYPE PER CHARACTERISTIC | -0.5 VOLTS MAXIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE |
CZEQ | TIME RATING PER CHACTERISTIC | 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 250.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
CZER | MEMORY DEVICE TYPE | ROM |
TEST | TEST DATA DOCUMENT | 96906-MIL-STD-883 STANDARD (INCLUDES INDUSTRY OR ASSOCIATION STANDARDS, INDIVIDUAL MANUFACTUREER STANDARDS, ETC.). |
TTQY | TERMINAL TYPE AND QUANTITY | 28 PRINTED CIRCUIT |
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